Please use this identifier to cite or link to this item: http://cimav.repositorioinstitucional.mx/jspui/handle/1004/1092
Synthesis, microstructural, optical and mechanical properties of yttria stabilized zirconia thin films
PATRICIA AMEZAGA MADRID
ABEL HURTADO MACIAS
WILBER ANTUNEZ FLORES
PEDRO PIZA RUIZ
MARIO MIKI YOSHIDA
Acceso Abierto
Sin Derechos Reservados
Thin film
Microstructure
Mechanical properties
Thin films of yttria-stabilized zirconia (YSZ) exhibit exceptional properties, such as high thermal, chemical and mechanical stability. Here, we report the synthesis of YSZ thin films by aerosol assisted chemical vapour deposition onto borosilicate glass and fused silica substrates. Optimum deposition temperatura was 673±5 K. In addition, different Y content was tried to analyse its influence in the microstructure and properties of the films. The films were uniform, transparent and non-light scattering. Surface morphology and cross sectional microstructure were studied by field emission scanning electron microscopy. The microstructure of the films was characterized by grazing incidence X-ray diffraction. Crystallite size and lattice parameter were obtained. Optical properties were analysed from reflectance and transmittance spectra; from these measurements, optical constants and band gap were obtained. Quantum confinement effect, due to the small grain size of the films, was evident in the high band gap energy obtained. Nanoindentation tests were realized at room temperature employing the continuous stiffness measurement method, to determine the hardness and elastic modulus as a function of Y content.
2011
Artículo
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