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http://cimav.repositorioinstitucional.mx/jspui/handle/1004/1690| Método para la detección de señales en patrones de difracción de monocristales | |
| AIDALHY CAMPOS FRIAS CARLOS ELIAS ORNELAS GUTIERREZ | |
| Acceso Abierto | |
| Sin Derechos Reservados | |
| diffraction pattern | |
| The correct use of information in science and technology is very important for its progress, nowadays the equipment used for the scientific and technological development provides results that are later interpreted by the researchers, in most of the above mentioned equipment the results are images full of information which has to be analyzed. A powerful stage with multiple benefits in this field it is the image preprocessing by means of intelligent systems, which are capable to do image analysis throwing very useful results that enhance the scientific and technological information. There are currently more than 500 functions in the computational vision specialized open source library OpenCV, which associated with the C ++ programming language, this functions are used for application development in many areas of computer vision such as products inspection, medical images, safety, user's interfaces, camera calibration, stereoscopic vision and robotics. In this development and research work, by using the available functions and modifying the exposed methods, we present a proposal for signal detection in images originated in the Transmission Electron Microscope (known as diffraction patterns), which are attached to the detailed analysis of crystalline structures used in the study of the materials science, the results show a profit of at least 18 % in the detection of signs by means of the method proposed in this work. | |
| 2015 | |
| Memoria de congreso | |
| Español | |
| OTRAS | |
| Versión revisada | |
| submittedVersion - Versión revisada | |
| Aparece en las colecciones: | Artículos de Congresos |
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| Fichero | Tamaño | Formato | |
|---|---|---|---|
| Congreso 2015 Tania-CIRC2015.pdf | 1.91 MB | Adobe PDF | Visualizar/Abrir |