Por favor, use este identificador para citar o enlazar este ítem:
http://cimav.repositorioinstitucional.mx/jspui/handle/1004/216| Estudio de Materiales Nanométricos con Microscopio Electrónico de Barrido SEM | |
| Rodolfo Salas Cepeda | |
| FRANCISCO PARAGUAY DELGADO | |
| Acceso Abierto | |
| Atribución | |
| La microscopia electrónica de barrido, SEM (por sus siglas en inglés, Scanning Electron
Microscope), es un avance tecnológico que se concretó para el estudio de materiales
nanométricos en últimos años alrededor del mundo, se ha podido lograr inmensos
avances a la visualización de materiales a nivel nanométrico.
Con el desarrollo de este trabajo se hace una revisión del funcionamiento del
Microscopio electrónico de barrido SEM y sus posibles aplicaciones.
Con las imágenes obtenidas y tomadas de bibliografía, se desarrolla la metodología para
su correcta interpretación se presenta ejemplos de imágenes relacionadas con el estudio
de nanomateriales. The human being in his eagerness to know what things are made has given him forever importance of this, struggling to discover this fact what is around you, bringing the concerns and opening the door to an amazing area, microscopy . The observation of small objects has always been among the biggest challenges faced by men and without a doubt , the Scanning Electron Microscope (SEM) has been among the main tools that have allowed him to emerge victorious from this challenge. But the development of this formidable instrument was not an easy road. The SEM allows observation and surface characterization of organic and inorganic materials, providing morphological information of the analyzed material. So that from the interaction of electrons with the sample different signal types that are generated from the sample and used to discuss features occur , for example, can conduct studies to morphological aspects of microscopic areas of different materials working with researchers in the scientific community and private companies , in addition to the processing and analysis of images obtained . Major utilities are SEM high resolution (~ 10 Å), the large depth of field which gives three-dimensional look to images and simple sample preparation. The SEM may be equipped with different sensors, among which may be mentioned : a detector of secondary electrons to obtain high resolution and surface topography of the SEI ( Secondary Electron Image ) a backscattered electron detector which allows imaging composition BEI ( Backscattered Electron Image) , and a detector energy dispersive x -ray EDS (Energy dispersive Spectrometer) can collect the characteristic x -rays generated by the sample and with it determine the elemental composition , imaging the distribution of elements surfaces . | |
| 2014-08 | |
| Tesis de maestría | |
| Español | |
| BIOLOGÍA Y QUÍMICA | |
| Aparece en las colecciones: | Maestría en Nanotecnología |
Cargar archivos:
| Fichero | Descripción | Tamaño | Formato | |
|---|---|---|---|---|
| Tesis Rodolfo Salas Cepeda.pdf | 3.13 MB | Adobe PDF | Visualizar/Abrir |