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http://cimav.repositorioinstitucional.mx/jspui/handle/1004/2417| Three-layer thermal model to measure the heat capacity of metallic thin films | |
| Joel Odelin Novelo Segura Andrés Iván Oliva Arias Abel Hurtado MacÍas | |
| Acceso Abierto | |
| Atribución-NoComercial | |
| Nanotechnology applications have become a reality in some materials science fields. Thermal properties of metallic nanofilms reported in the literature have shown to posses different values as compared with their bulk properties. The determination of the thermal properties plays a key role in the design of components and in the production of new materials. In this work a new method to estimate the heat capacity of metallic thin films is discussed. The analyzed thermal model consists in a three-layer system formed by a film/substrate/film. To estimate the heat capacity of the metallic film, it is required to apply a constant dc current in one metallic layer such that the three-layer system reaches the steady-state. In this condition, a dc current pulse is applied in the same metallic layer acquiring in real time the corresponding voltage and the changes of temperature as a consequence of the applied pulse. The three-layered model is analyzed by using coupling differential equations which includes the different mechanisms of heat transfer involved as a function of the physical properties and the geometrical parameters. Simulated results obtained from Au/glass/Au, Al/glass/Al, and Cu/glass/Cu systems for different electrical pulses and film thicknesses are discussed. These analytical results provide tools for developing better experimental conditions to estimate the heat capacity of metallic nanofilms. Keywords: thermal model, three-layer, heat capacity, metallic films | |
| 2010 | |
| Artículo | |
| Inglés | |
| TÉCNICAS DE MEDIDA DEL CALOR | |
| Versión publicada | |
| publishedVersion - Versión publicada | |
| Aparece en las colecciones: | Artículos de Congresos |
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| SOMI-2010-RDM.pdf | 746.41 kB | Adobe PDF | Visualizar/Abrir |