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http://cimav.repositorioinstitucional.mx/jspui/handle/1004/972| X-ray absorption spectroscopy and X-ray diffraction analysis of crystalline CoTi2 grown by DC co-sputtering: A theoretical and experimental comparison | |
| IGNACIO YOCUPICIO VILLEGAS | |
| HILDA ESPERANZA ESPARZA PONCE JOSE ALBERTO DUARTE MOLLER | |
| Acceso Abierto | |
| Sin Derechos Reservados | |
| X-Ray | |
| A series of thin films were grown at 500 ◦C with a Co and Ti base on silico substrate oriented at (4 0 0) by means of the DC co-sputtering technique. For 7 and 11% Co concentrations, 50, 80, and 110W were used. CoTi2 structure was simulated with the FEFF routine of the WinXAS program. XAS analyses were also performed in order to compare simulated results with experimental results. The X-ray diffraction and atomic absorption results reveal a CoTi2 (Fd-3ms) and Ti (P63/mmc) phase, while extended X-ray absorption fine structure spectroscopy shows slight variations in the coordination numbers and distances from close neighbors and have 0–7% deviations. The results showed good agreement between the theoretical and experimental results. | |
| 2009 | |
| Artículo | |
| Inglés | |
| OTRAS | |
| Versión revisada | |
| submittedVersion - Versión revisada | |
| Aparece en las colecciones: | Artículos |
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| Fichero | Descripción | Tamaño | Formato | |
|---|---|---|---|---|
| X-ray absorption spectroscopy and X-ray diffraction analysis of crystalline CoTi2 PDF 2009.pdf | 540.32 kB | Adobe PDF | Visualizar/Abrir |